Learn more

TORAY RES CT KK

Overview
  • Total Patents
    27
  • GoodIP Patent Rank
    233,798
About

TORAY RES CT KK has a total of 27 patent applications. Its first patent ever was published in 1999. It filed its patents most often in Japan. Its main competitors in its focus markets electrical machinery and energy are TRUWEAL INC, ANDERSEN & MEYER ELEK ARTIKLER and SANG IL SYSTEM CO LTD.

Patent filings in countries

World map showing TORAY RES CT KKs patent filings in countries
# Country Total Patents
#1 Japan 27

Patent filings per year

Chart showing TORAY RES CT KKs patent filings per year from 1900 to 2020

Focus industries

Focus technologies

Top inventors

# Name Total Patents
#1 Yoshikawa Masanobu 7
#2 Matoba Nobunori 3
#3 Moriwaki Hirobumi 2
#4 Maruyama Kiko 2
#5 Nagai Naoto 2
#6 Sugie Ryuichi 2
#7 Oishi Manabu 2
#8 Tanigawa Yukito 1
#9 Takatsu Masatoshi 1
#10 Sasagawa Ritsu 1

Latest patents

Publication Filing date Title
JP2015152546A Defect evaluation method and defect evaluation method using the same device
JP2013186048A Gas adsorption instrument and gas analysis method
JP2011033518A Surface intensifying raman spectroscopy
JP2010217135A Manufacturing method of near field probe
JP2010085382A Infrared microscope device and spectroscopic analysis method
JP2009204559A Optical analyzer and method of spectroscopic analysis
JP2009115728A Conveying vessel, and method of measuring impurity in gas
JP2008249478A Cathode luminescence apparatus and analysis method using the same
JP2007147607A Method of measuring stress or strain of sample
JP2006052965A Analyzing method due to measurement of resonance raman scattering
JP2005326160A Quantitative determination method and micro stereoscopic analysis method for solute in solution
JP2004333480A Method and apparatus for measuring dynamic viscoelasticity
JP2005221290A Method for analyzing macromolecular sample
JP2005024384A Compression fatigue testing method
JP2004347334A Analytical method for condensation type resin
JP2004347335A Micro spectrometric analytical method
JP2004325151A Elastic modulus measuring method of film
JP2003232709A Method for measuring modulus of elasticity in thin film
JP2004085416A Apparatus and analytical method using the same
JP2004085415A Analytical method