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SDA CO LTD

Overview
  • Total Patents
    46
  • GoodIP Patent Rank
    49,634
  • Filing trend
    ⇧ 100.0%
About

SDA CO LTD has a total of 46 patent applications. It increased the IP activity by 100.0%. Its first patent ever was published in 2007. It filed its patents most often in Republic of Korea, China and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, optics and micro-structure and nano-technology are LUKEN TECH, NEMS PROBE CO LTD and TSC MEMSYS CO LTD.

Patent filings in countries

World map showing SDA CO LTDs patent filings in countries

Patent filings per year

Chart showing SDA CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Im Chang Min 45
#2 Sim Sang Bum 36
#3 Lee Duk Kyu 13
#4 Kim Woong Kyum 12
#5 Moon Young Soung 10
#6 Chu Sung Il 8
#7 Kang Shin Kyo 8
#8 Kim Il Joong 2
#9 Jeon Hyun Soo 2
#10 Cho Yun Kee 2

Latest patents

Publication Filing date Title
KR20200063009A Probe card
KR102093419B1 Probe Card
KR102103975B1 Space transformer for probe card and Manufacturing method thereof
KR102068699B1 Manufacturing method of MEMS probe for inspecting semiconductor by using laser
KR20200023150A Manufacturing method of MEMS probe tip by ultra high frequency laser and MEMS probe tip designed by same method
KR20200023149A Apparatus of inspecting semiconductor for high frequency made by using laser and Manufacturing method thereof
KR102072451B1 Probe Card Head Block
KR102072452B1 Manufacturing method of probe card head block
KR20190024654A Laser machining apparatus including dust inhaling function
KR20190045814A Method for controlling provision of image to exposing of digital micromirror device for exposing of tiny line width at high speed
WO2019035520A1 Method by which digital micromirror device controller for high-speed exposure of fine line width controls exposure image output
KR20190061647A Space Transformer for Probe Card and Manufacturing Method Thereof
KR101980865B1 Probe Card
KR101892647B1 Method for controlling provision of image to exposing of digital micromirror device for exposing of tiny line width at high speed to high precision
KR20190007626A Laser machining method
KR20190007625A Laser machining method
KR20180056335A Probe Card Electrical Characteristic Measuring Device
KR20180056336A Probe Card Low Leakage Current Measuring Device
KR20170020250A Digital Micromirror Device Controller and method for processing exposing image output thereof
WO2017030318A1 Digital micromirror device controller and exposure image output processing method of same