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TECHNOPROBE SPA

Overview
  • Total Patents
    315
  • GoodIP Patent Rank
    5,586
  • Filing trend
    ⇧ 9.0%
About

TECHNOPROBE SPA has a total of 315 patent applications. It increased the IP activity by 9.0%. Its first patent ever was published in 2001. It filed its patents most often in WIPO (World Intellectual Property Organization), Taiwan and EPO (European Patent Office). Its main competitors in its focus markets measurement, electrical machinery and energy and audio-visual technology are ATG TEST SYSTEMS GMBH, SEIN BLUETEC CO LTD and ATG LUTHER & MAELZER GMBH.

Patent filings per year

Chart showing TECHNOPROBE SPAs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Crippa Roberto 113
#2 Vallauri Raffaele 75
#3 Vettori Riccardo 59
#4 Felici Stefano 58
#5 Crippa Giuseppe 48
#6 Maggioni Flavio 47
#7 Liberini Riccardo 36
#8 Acconcia Daniele 26
#9 Perego Daniele 22
#10 Bertarelli Emanuele 21

Latest patents

Publication Filing date Title
WO2021023744A1 Manufacturing method for manufacturing contact probes for probe heads of electronic devices and corresponding contact probe
WO2021023739A1 Probe head for electronic devices and corresponding probe card
WO2021023740A1 Vertical probe head with a probe guide comprising circuit components integrated therein
WO2020136045A1 Vertical probe head having an improved contact with a device under test
TW202022387A Vertical probe head with improved contact properties towards a device under test
KR20210028231A Probe card for high frequency applications
SG11202011171TA High-performance probe card in high-frequency
CN111742231A Apparatus and method for automatically assembling a probe
CN111602063A Cantilever contact probe and corresponding probe head
KR20200109349A Cantilever probe head and corresponding contact probe
WO2019129585A1 Probe head having vertical probes with respectively opposite scrub directions
TW201928359A Contact probe for a testing head for testing electronic devices
TW201923357A Contact probe for a testing head for testing high-frequency devices
IT201800007898A1 Contact probe with improved performance and related measuring head
EP3586153A1 Vertical probe testing head with improved frequency properties
KR20190119105A Test head with improved frequency characteristics
WO2018149847A1 Probe card for high-frequency applications
TW201833564A Testing head having improved frequency properties
TW201833565A Probe head for a testing apparatus of electronic devices with enhanced filtering properties
CN110662969A Contact probe and associated probe head for an apparatus for testing electronic devices