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TSC MEMSYS CO LTD

Overview
  • Total Patents
    41
About

TSC MEMSYS CO LTD has a total of 41 patent applications. Its first patent ever was published in 2008. It filed its patents most often in Republic of Korea. Its main competitors in its focus markets measurement, semiconductors and audio-visual technology are LUKEN TECH, YULIM HITECH INC and LUKEN TECHNOLOGIES.

Patent filings in countries

World map showing TSC MEMSYS CO LTDs patent filings in countries
# Country Total Patents
#1 Republic of Korea 41

Patent filings per year

Chart showing TSC MEMSYS CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Goo Chul Hwan 6
#2 Kim Ji Won 5
#3 Lee Oug Ki 5
#4 Kim Mi Jee 4
#5 Choi Ji Hoon 4
#6 Jang Dong Jun 4
#7 Yoo Ju Hyung 4
#8 Jun Woon Pyo 3
#9 Cho Jong Hyun 3
#10 Ju Ho Young 3

Latest patents

Publication Filing date Title
KR20110015492A Electric connecting apparatus and method of manufacturing the same
KR20120009711A Flat pannel display inspecting assembly
KR20110133196A Probe assembly for inspected the flat panel display device
KR20110133279A Flat pannel display inspecting assembly
KR20110121066A Method of manufacturing a flexible contact film used as probes of a probe unit
KR20110121064A Probe unit
KR20110105481A Apparatus for testing light emitting diode
KR20110062884A Laser processing apparatus and processing method
KR20110062886A Particle removal device for a laser processing apparatus and laser processing apparatus haivng the same
KR20110062885A Laser processing method
KR20110062887A Laser processing apparatus having an auto-focuing unit and a laser auto-focusing method thereof
KR20110052097A Flexible printed circuit board, method of manufacturing the same, method of testing an object and probe unit having the same
KR20110041690A Probe unit and method of manufacturing the same
KR20110034177A Probe unit and method of manufacturing the same
KR20110026665A Probe unit
KR20110015085A Probe card
KR20100120415A Probe structure and method of manufacturing a probe structure
KR20100107105A Probe block, probe assembly having the same and method for manufacturing of the same
KR20100070873A Joining member of one touch form, probe assembly having the same and method of assembling probe assembly using the same
KR20100048673A Probe structure and method of manufacturing a probe structure