| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Taiwan | 8 | |
| #2 | China | 3 | |
| #3 | United States | 1 |
| # | Industry | |
|---|---|---|
| #1 | Computer technology | |
| #2 | Measurement | |
| #3 | Semiconductors |
| # | Technology | |
|---|---|---|
| #1 | Static stores | |
| #2 | Measuring electric variables | |
| #3 | Electric digital data processing | |
| #4 | Semiconductor devices |
| # | Name | Total Patents |
|---|---|---|
| #1 | Wang Gyh-Bin | 6 |
| #2 | Ting Tah-Kang Joseph | 5 |
| #3 | Wang Ming-Hung | 3 |
| #4 | Wang Gyh Bin | 3 |
| #5 | Ting Tah Kang | 3 |
| #6 | Tien Li Chin | 2 |
| #7 | Tien Li-Chin | 2 |
| #8 | Wu Chun-Peng | 1 |
| #9 | Hsieh Yung Ching | 1 |
| #10 | Wu Chun Peng | 1 |
| Publication | Filing date | Title |
|---|---|---|
| TWI671534B | Method for testing semiconductor die pad untouched by probe and related test circuit | |
| TW201812755A | Memory architecture | |
| TW201832243A | Circuit topology of memory chips with embedded function test module | |
| TW201730769A | Memory device | |
| TW201539476A | Control method of memory device, memory device and memory system | |
| TW201545170A | Memory architecture | |
| TW201533738A | Adaptive contorl method based on input clock and related adaptive contorlled apparatus | |
| TW201237982A | High speed test circuit and method |