| # | Country | Total Patents | |
|---|---|---|---|
| #1 | EPO (European Patent Office) | 5 | |
| #2 | China | 4 | |
| #3 | United States | 4 | |
| #4 | WIPO (World Intellectual Property Organization) | 4 | |
| #5 | Republic of Korea | 3 | |
| #6 | Belgium | 1 | |
| #7 | Japan | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Computer technology |
| # | Technology | |
|---|---|---|
| #1 | Measuring electric variables | |
| #2 | Electric digital data processing |
| # | Name | Total Patents |
|---|---|---|
| #1 | Vervaeke Koen | 20 |
| #2 | Philips Lieven | 10 |
| #3 | Kliché Stephan | 3 |
| #4 | Kliche Stephan | 2 |
| #5 | Vervaeke Koen Jozef Theo | 1 |
| #6 | Koen Jozef Theo Vervaeke | 1 |
| Publication | Filing date | Title |
|---|---|---|
| EP2930651A1 | Method and device for measuring a magnetic field distribution of a magnet along a main surface of said magnet | |
| EP2930649A1 | Devices and methods for determining a magnetic field | |
| EP2930650A1 | Devices and methods for determining a magnetic field | |
| EP2720059A1 | Devices and methods for determining a magnetic field distribution of a magnet along a main surface of said magnet. | |
| JP2012185155A | Apparatus and method for characterizing magnetic system |