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UNITEST INC

Overview
  • Total Patents
    173
  • GoodIP Patent Rank
    51,469
  • Filing trend
    ⇧ 150.0%
About

UNITEST INC has a total of 173 patent applications. It increased the IP activity by 150.0%. Its first patent ever was published in 2002. It filed its patents most often in Republic of Korea, United States and Japan. Its main competitors in its focus markets measurement, computer technology and semiconductors are ONE TEST SYSTEMS, CHENG WU-TUNG and NEXTEST SYSTEMS CORP.

Patent filings in countries

World map showing UNITEST INCs patent filings in countries

Patent filings per year

Chart showing UNITEST INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kang Jong Koo 36
#2 Lee Eui Won 19
#3 Oh Hyo Jin 19
#4 Kim Sun Whan 16
#5 Kim Bong Hwan 16
#6 Kim Jong Bok 14
#7 Choi Young Bae 13
#8 You Ho Sang 11
#9 Kim Dae Kyoung 9
#10 Huh Jae Suk 8

Latest patents

Publication Filing date Title
KR102148773B1 Auto bias control method and system for improving the load temperature of chamber
KR102152914B1 Burn-in test apparatus
KR20210025285A Chamber type inspection device
KR20210007213A Perovskite solar cell module and its encapsulation method
KR102042604B1 Shearing die for continuous coating of nano thin films and coating method using it
KR101932187B1 A heat radiating structure of sunlight generation inverter
KR101926326B1 Charging device to minimize waste power at sunrise and sunset in solar inverter system and method thereof
US2018261304A1 Apparatus and method for measuring round-trip time of test signal using programmable logic
KR101883286B1 Control device for ac smps which start automatically according to sunrise for solar inverter system and the method wherein
KR20190052364A Solar cell system
KR20180123372A PCB Connector
KR20180045917A Test board for burn-in testing
KR20170119231A Apparatus for controlling temperature of test chamber
KR101676774B1 Burn-In Tester
KR101737461B1 System for obtaining a driving power source to the power generation of the solar cell and method therefor
US2015095712A1 Non-mounted storage test device based on FPGA
US2015095723A1 Detection system for detecting fail block using logic block address and data buffer address in a storage tester
JP2015031691A Memory test simultaneous determination system
JP2015031690A Apparatus for acquiring data of fast fail memory and method thereof
JP2015032310A Device for calculating round-trip time of memory test using programmable logic