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MERITECH CO LTD

Overview
  • Total Patents
    34
  • GoodIP Patent Rank
    95,131
  • Filing trend
    0.0%
About

MERITECH CO LTD has a total of 34 patent applications. It increased the IP activity by 0.0%. Its first patent ever was published in 2006. It filed its patents most often in Republic of Korea, Japan and Taiwan. Its main competitors in its focus markets measurement, audio-visual technology and computer technology are NES TEK KOREA CO LTD, QUALMAX TESTECH INC and MAGCAM NV.

Patent filings in countries

World map showing MERITECH CO LTDs patent filings in countries

Patent filings per year

Chart showing MERITECH CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kang Seung Nam 14
#2 Yun Chae Young 10
#3 Park Yi Dong 7
#4 Lim Young Soon 7
#5 Choi Yun Sook 6
#6 Lee Hae Won 5
#7 Seo Moon Il 5
#8 Bang Yong Woo 5
#9 Yun Chao Young 4
#10 Yun Chae-Young 4

Latest patents

Publication Filing date Title
KR20210033115A Wireless heating socket for easy automation of device high temperature aging test.
KR102216598B1 Device high temperature aging test automation system using heating socket to prevent cable damage
KR102114678B1 Electronic parts heat resistance performance test system with loader
KR20200104444A Electronic parts heat resistance performance test system
KR20200104445A Electronic parts heat resistance performance test system
KR102070643B1 DIMM Distributed system for improved stability and test efficiency
KR20200010708A DIMM Distributed architecture for improved stability and test efficiency
KR102058376B1 Integrated camera module inspection equipment
JP2018182608A Mobile terminal, communication system, method, and computer program
JP2018182606A Signal transmission quality evaluation system, method, and computer program
JP2018182607A Signal transmission quality evaluation system, method, and computer program
KR20170049697A Real speed high temperature aging system for semiconductor
KR20160086510A Contactor for semiconductor device test
KR20160086509A Method for manufacturing elastic contactor
KR101482911B1 Socket for semiconductor device test
KR101290669B1 Bump-type probe, glass block panels for testing
KR101242372B1 Bump-type probe, glass block panels for testing
KR101241969B1 Bump test glass panel type block structure of the probe
KR20130058485A Method for manufacturing glass type probe for testing flat paneldisplay
KR101083711B1 Light board for checking a flat display device and manufacture method of the same