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KING YUAN ELECTRONICS CO LTD

Overview
  • Total Patents
    552
  • GoodIP Patent Rank
    14,437
  • Filing trend
    ⇧ 8.0%
About

KING YUAN ELECTRONICS CO LTD has a total of 552 patent applications. It increased the IP activity by 8.0%. Its first patent ever was published in 2000. It filed its patents most often in Taiwan, China and Japan. Its main competitors in its focus markets measurement, semiconductors and audio-visual technology are MJC PROBE INC, MPI CORP and OKINS ELECTRONICS CO LTD.

Patent filings in countries

World map showing KING YUAN ELECTRONICS CO LTDs patent filings in countries
# Country Total Patents
#1 Taiwan 252
#2 China 200
#3 Japan 43
#4 United States 36
#5 Republic of Korea 21

Patent filings per year

Chart showing KING YUAN ELECTRONICS CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Lin Yuan-Chi 26
#2 Yuanji Lin 21
#3 Ni Cheng Chin 17
#4 Zhan Xunliang 12
#5 Lin Yuan-Ji 10
#6 Zhihong Xie 10
#7 Benshan Zhao 10
#8 Hsieh Chih-Hung 10
#9 Liu Guangxiang 10
#10 Chang Chiu-Fang 10

Latest patents

Publication Filing date Title
TWI715509B Dynamic test module with limited over-rotation mechanism
TWI714457B Testing system and its testing platform
TWI717169B Light source calibrating system and method for wafer-testing systems
TWI709727B Ic chip appearance inspection module
CN112230122A Burn-in test device and burn-in test equipment thereof
CN112025569A Connector clamping mechanism
TWI696323B Connector clamping mechanism
CN111829572A Hygrometer test module and test system thereof
CN111856230A Image testing system and image extracting card thereof
TWI690702B Hygrometer test module and test system thereof
TWI702546B Image test system and its image capture card
CN111220767A Elastic buffer seat for testing biochip, testing module and testing equipment thereof
TW202020444A Resilient cushioning block of bio-chip test and test module and test apparatus thereof
CN111190087A Semiconductor element test carrying disc with floating containing seat and test equipment thereof
TWI676033B Semiconductor testing carrier with buffering container and testing apparatus thereof
CN110389262A Measurement structure
TWI645202B Measuring structure
CN110161977A Measuring system and its measurement method
TWI665457B Measuring system and its measuring method thereof
CN110099348A Has the microphone element test holder structure of more acoustical generators