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SEMICONDUCTOR DIAGNOSTICS INC

Overview
  • Total Patents
    23
About

SEMICONDUCTOR DIAGNOSTICS INC has a total of 23 patent applications. Its first patent ever was published in 1997. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and Australia. Its main competitors in its focus markets measurement and semiconductors are TSE CO LTD, ESSAI INC and SOLID STATE MEASUREMENTS INC.

Patent filings per year

Chart showing SEMICONDUCTOR DIAGNOSTICS INCs patent filings per year from 1900 to 2020

Focus industries

Top inventors

# Name Total Patents
#1 Lagowski Jacek 20
#2 Savtchouk Alexander 12
#3 Wilson Marshall D 6
#4 Faifer Vladimir 5
#5 Wilson Marshall 4
#6 Kochey Nick 4
#7 Aleinikov Andrei 4
#8 Jastrzebski Lubomir L 4
#9 Edelman Piotr 3
#10 Schrayer Charles 3

Latest patents

Publication Filing date Title
WO2008154186A1 Enhanced sensitivity non-contact electrical monitoring of copper contamination on silicon surface
US2006208256A1 Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentration
US2006267622A1 Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers
US6815974B1 Determining composition of mixed dielectrics
US6771091B2 Method and system for elevated temperature measurement with probes designed for room temperature measurement
AU8129101A Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages
US6680621B2 Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current
US6597193B2 Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current
US6569691B1 Measurement of different mobile ion concentrations in the oxide layer of a semiconductor wafer
US6512384B1 Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages
US6538462B1 Method for measuring stress induced leakage current and gate dielectric integrity using corona discharge
US6114865A Device for electrically contacting a floating semiconductor wafer having an insulating film
US6037797A Measurement of the interface trap charge in an oxide semiconductor layer interface