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JFE TECHNO RES CORP

Overview
  • Total Patents
    76
  • GoodIP Patent Rank
    55,627
  • Filing trend
    ⇧ 140.0%
About

JFE TECHNO RES CORP has a total of 76 patent applications. It increased the IP activity by 140.0%. Its first patent ever was published in 2003. It filed its patents most often in Japan, Taiwan and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets semiconductors, measurement and biotechnology are VISTEC SEMICONDUCTOR SYSTEMS J, HYPERNEX INC and OPTOLANE TECHNOLOGIES INC.

Patent filings in countries

World map showing JFE TECHNO RES CORPs patent filings in countries

Patent filings per year

Chart showing JFE TECHNO RES CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Fukuda Yasutaka 15
#2 Abe Masahiro 13
#3 Ogawa Atsushi 8
#4 Hayashi Ihei 8
#5 Ariizumi Takashi 7
#6 Kondo Koji 7
#7 Shibuya Kiyoshi 6
#8 Toyooka Takaaki 6
#9 Okada Naoto 5
#10 Takahashi Yoshiya 5

Latest patents

Publication Filing date Title
JP2020052036A Fluid flow measurement device and gas detection device
JP2019148607A Inspection device
JP2020190516A Tensile test method and device for metal material
JP2020165867A Film thickness measurement device and film thickness measurement method
JP2020051982A Image inspection device and inspection model construction system
JP2020051981A Inspection device
JP2020039312A Chromosomal abnormality determination system, measurement device and analyzer
JP2020038078A Inspection device for foods
JP2020038077A Bone inspection device
JP2019158859A Temperature distribution measuring device and method for measuring temperature distribution
JP2019060852A Film thickness measuring method, film thickness measuring program and film thickness measuring device
JP2019020419A Film thickness calculation method, film thickness calculation program, and film thickness calculation device
JP2018169390A Chromosome abnormality determination device
JP2018146576A Three-dimensional shape measuring device and three-dimensional shape measuring method
JP2019144118A Film thickness measuring device and film thickness measuring method
JP2019144005A Apparatus for measuring content of component
JP2019020183A Film thickness measurement method and film thickness measuring device
JP2018197677A Environmental test device
JP2018194464A Fingerprints detector and method for detecting fingerprints
JP2018179616A Fatigue characteristic detection method and fatigue characteristic detector