NANDA TECHNOLOGIES GMBH has a total of 21 patent applications. Its first patent ever was published in 2009. It filed its patents most often in Taiwan, EPO (European Patent Office) and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets semiconductors and measurement are RISOTETSUKU JAPAN KK, SUPRASENSOR TECH LLC and DIMMLER KLAUS.
# | Country | Total Patents | |
---|---|---|---|
#1 | Taiwan | 6 | |
#2 | EPO (European Patent Office) | 5 | |
#3 | WIPO (World Intellectual Property Organization) | 5 | |
#4 | United States | 2 | |
#5 | China | 1 | |
#6 | Republic of Korea | 1 | |
#7 | Singapore | 1 |
# | Industry | |
---|---|---|
#1 | Semiconductors | |
#2 | Measurement |
# | Technology | |
---|---|---|
#1 | Semiconductor devices | |
#2 | Analysing materials |
# | Name | Total Patents |
---|---|---|
#1 | Markwort Lars | 21 |
#2 | Guittet Pierre-Yves | 10 |
#3 | Kharrazian Reza | 7 |
#4 | Kappel Christoph | 7 |
#5 | Eckerl Klaus | 5 |
#6 | Chhibber Rajeshwar | 5 |
#7 | Harendt Norbert | 5 |
#8 | Halder Sandip | 3 |
#9 | Hegels Ernst | 3 |
#10 | Estermann Markus | 3 |
Publication | Filing date | Title |
---|---|---|
TW201248755A | Methods of inspecting and manufacturing semiconductor wafers | |
WO2012025221A1 | Methods and systems for inspecting bonded wafers | |
TW201226884A | Semiconductor wafer inspection system and method | |
WO2011020589A1 | Method of inspecting and processing semiconductor wafers | |
EP2378548A1 | Methods of processing and inspecting semiconductor substrates | |
EP2339331A1 | Inspection and positioning systems and methods | |
KR20110000560A | Optical inspection system and method |