Learn more

INTEKPLUS CO LTD

Overview
  • Total Patents
    211
  • GoodIP Patent Rank
    31,541
  • Filing trend
    ⇩ 16.0%
About

INTEKPLUS CO LTD has a total of 211 patent applications. It decreased the IP activity by 16.0%. Its first patent ever was published in 2000. It filed its patents most often in Republic of Korea, WIPO (World Intellectual Property Organization) and Taiwan. Its main competitors in its focus markets measurement, semiconductors and computer technology are HELMUT FISCHER GMBH INST FÜR ELEKTRONIK UND MESSTECHNIK, HELMUT FISCHER GMBH INST FUR ELEKTRONIK UND MESSTECHNIK and AOTI OPERATING CO INC.

Patent filings per year

Chart showing INTEKPLUS CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kang Min Gu 64
#2 Lim Ssang Gun 64
#3 Lee Sang Yoon 48
#4 Lim Ssang-Gun 43
#5 Lee Sang Yun 40
#6 Lee Hyun Min 33
#7 Joo Byeong Gwon 24
#8 Kang Min-Gu 23
#9 Lee Sang-Yun 23
#10 Ko Seung Gyu 21

Latest patents

Publication Filing date Title
KR20210025142A Automatic change system for reel
KR20200107404A Apparatus for inspecting display panel
KR20200103150A Visual inspection system
KR20200076078A Apparatus for inspecting cover glass
KR20200038697A Inspection apparatus for flexible display and Method for inspecting flexible display using thereof
KR20200007292A Apparatus for inspecting exterior of battery
KR102036067B1 Optical measurement device for 3d morphology and refractive index
KR20190110336A Image acquisition apparatus and method using multichannel lighting
KR102007004B1 Apparatus for measuring three dimensional shape
KR20190102361A Method for in vitro diagnostic device by measuring fluorescence lifetime and in vitro diagnostic device for performing the same
KR20190095035A Apparatus for inspecting exterior of semiconductor device
CN110192079A 3 d shape measuring apparatus and measurement method
KR20170113159A Ultrasensitive biomarker quantification method using photooxidation-induced amplification
KR101859172B1 Measuring apparatus to obtain multiple fluorescence lifetimes by calculating least square errors using imaginay fluorescence distribution model using the signal from the analong mean delay method and measuring method thereof
KR101835815B1 Apparatus and method for measuring fluorescence lifetime
KR20180053119A 3-dimensional shape measurment apparatus and method thereof
KR20180053125A 3-dimensional shape measurment apparatus and method thereof
CN107490578A Semiconductor element check device
TW201740127A Apparatus for inspecting semiconductor device
KR20170114198A Apparatus for packing semiconductor device with carrier tape