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ION BEAM SERVICES

Overview
  • Total Patents
    129
  • GoodIP Patent Rank
    30,982
About

ION BEAM SERVICES has a total of 129 patent applications. Its first patent ever was published in 2000. It filed its patents most often in EPO (European Patent Office), China and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets electrical machinery and energy, semiconductors and surface technology and coating are ADVANCED MICRO FABRICATION EQUIPMENT INC CHINA, COLLINS KENNETH S and ADVANCED ION BEAM TECH INC.

Patent filings per year

Chart showing ION BEAM SERVICESs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Roux Laurent 103
#2 Torregrosa Frank 86
#3 Boescke Tim 10
#4 Tisserand Stephane 9
#5 Torregrosa Franck 9
#6 Mathieu Gilles 7
#7 Kania Daniel 6
#8 Flory Francois 5
#9 Escoubas Ludovic 5
#10 Bechevet Bernard 5

Latest patents

Publication Filing date Title
FR3086101A1 DEVICE FOR IMPROVING THE CARRIER MOBILITY IN A MOSFET CHANNEL ON SILICON CARBIDE
FR3045206A1 ORDERING METHOD FOR AN IMPLANT OPERATING IN PLASMA IMMERSION
FR3033079A1 PROCESS FOR PASSIVATING A SUBSTRATE AND MACHINE FOR CARRYING OUT SAID METHOD
FR3020641A1 Passive gas diffusion device
FR3019562A1 Enclosure for treating a substrate using plasma
US2016204299A1 Method for doping silicon sheets
FR3017487A1 HIGH-VOLTAGE HEATING AND POLARIZED ELECTROSTATIC SUBSTRATE HOLDER
CN104937691A Ion implanter provided with plurality of plasma source bodies
FR3004465A1 Ion implantation machine having increased productivity
TW201349382A Support including an electrostatic substrate carrier
CN104106124A Method of controlling ion implanter in plasma immersion mode
TW201401326A A machine for implanting ions in plasma immersion mode for a low-pressure method
FR2980911A1 Control module for ion implanter
FR2976400A1 Ion implantation machine in plasma immersion mode for low pressure process.
FR2961010A1 Dose measuring device for ion implantation in plasma immersion mode
FR2961009A1 SECONDARY ELECTRON ELECTRON DETECTOR
WO2007144514A1 Method and apparatus for optically characterizing the doping of a substrate
WO2007023229A1 Summation-based mass measurement device
CN1989269A Ion implanter operating in pulsed plasma mode
WO2006003321A1 Ion implanter power supply which is intended to limit the loading effect