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ADE CORP

Overview
  • Total Patents
    153
About

ADE CORP has a total of 153 patent applications. Its first patent ever was published in 1970. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and Japan. Its main competitors in its focus markets measurement, semiconductors and machines are RUDOLPH TECHNOLOGIES INC, FOERSTER F and FORCE INST.

Patent filings per year

Chart showing ADE CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Poduje Noel S 30
#2 Mallory Roy E 23
#3 Abbe Robert C 18
#4 Judell Neil 13
#5 Sinha Jaydeep 11
#6 Tiemeyer Timothy R 9
#7 Abbe R 8
#8 Bills Richard Earl 7
#9 Domenicali Peter 6
#10 Mankame Anil 6

Latest patents

Publication Filing date Title
US2006178855A1 Defect size projection
WO2006017154A2 System and method for integrated data transfer, archiving and purging of semiconductor wafer data
JP2005252273A Wafer handling, and processing system therefor
JP2005167210A Handling and processing system for wafer
JP2005208042A Extended defect sizing
JP2005167208A Notched/flatted 200mm wafer edge grip end effector
US7280200B2 Detection of a wafer edge using collimated light
JP2005051213A Wafer gripping fingers to minimize distortion
US2005029823A1 Wafer gripping fingers to minimize distortion
KR20060024406A Method and system for classifying defects occurring at a surface of a substrate using graphical representation of multi-channel data
US2004182168A1 Shaped non-contact capacitive displacement sensors for measuring shaped targets
WO03065062A1 Method for high-accuracy non-contact capacitive displacement measurement of poorly connected targets
US6556941B2 Separation of periodic and non-periodic signal components
EP1311827A2 Ring chuck to hold 200 and 300 mm wafer
WO0211183A2 Shape accuracy improvement using a novel calibration approach
JP2002151562A Handling and treating system of wafer
US6476621B1 Self-bootstrapping transducer interface
US2002154295A1 Method and apparatus for classifying defects occurring at or near a surface of a smooth substrate
US6501269B1 Vector kerr magnetometry
WO0150084A1 Specimen topography reconstruction