Vacuum clamping device for clamping workpieces, measuring devices and methods for testing workpieces, in particular wafers
DE102016100707A1
Measuring device, measuring arrangement and method for determining measurement signals during a penetration movement of an indenter into a surface of a test specimen
DE102016100708A1
Measuring device for detecting measurement signals during a penetration movement of an indenter
DE102015103136A1
Method for the electronic control of a measuring stand
DE102014115383A1
Handheld device and mobile device for X-ray fluorescence analysis
DE102014106242A1
Device for positioning and aligning a rotationally symmetrical body
DE102014102684A1
Method for measuring a measurement object by means of X-ray fluorescence
DE102014101577A1
Method for the electrical control of a measuring stand and measuring stand for receiving a measuring probe
DE102013104251A1
Measuring probe for measuring the thickness of thin layers
DE102013102270A1
Optical mirror, X-ray fluorescence analyzer and method for X-ray fluorescence analysis
EP2381217A2
Measuring probe for non-destructive measurement of the thickness of thin coatings
EP2381218A2
Measuring probe for non-destructive measurement of the thickness of thin coatings
