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HELMUT FISCHER GMBH INST FUER ELEKTRONIK UND MESSTECHNIK

Overview
  • Total Patents
    57
  • GoodIP Patent Rank
    35,570
  • Filing trend
    0.0%
About

HELMUT FISCHER GMBH INST FUER ELEKTRONIK UND MESSTECHNIK has a total of 57 patent applications. It increased the IP activity by 0.0%. Its first patent ever was published in 2009. It filed its patents most often in EPO (European Patent Office), WIPO (World Intellectual Property Organization) and China. Its main competitors in its focus markets measurement, basic communication technologies and machines are PUUMALAINEN PERTTI, FORTE FAIRBAIRN INC and LUUKKALA MAURI.

Patent filings per year

Chart showing HELMUT FISCHER GMBH INST FUER ELEKTRONIK UND MESSTECHNIKs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Fischer Helmut 17
#2 Mästle Rüdiger 7
#3 Reime Gerd 5
#4 Wersal Helmut 5
#5 Anklamm Lars-Christian 5
#6 Vollmar Hans-Peter 4
#7 Volz Werner 3
#8 Czempas Dominic 3
#9 Helmut Fischer 2
#10 Decker Frank 2

Latest patents

Publication Filing date Title
EP3767224A1 Apparatus comprising at least one thz device and method of operating such apparatus
EP3742191A1 Terahertz measuring device and method of operating a terahertz measuring device
EP3742110A1 Apparatus for determining a layer thickness and method of operating such apparatus
EP3686547A1 Apparatus for determining a layer thickness of a plurality of layers arranged on a body
EP3660462A1 Apparatus for measuring a physical parameter and method of operating such apparatus
DE102018124767A1 Process for carrying out an X-ray fluorescence measurement process, as well as the associated X-ray fluorescence system and the associated computer program
DE102018211025A1 Electronic device with inductive sensor
DE102017129150A1 Method and device for measuring the thickness of non-magnetizable layers on a magnetizable base material
DE102016123010A1 Measuring device, measuring arrangement and method for determining measurement signals during a penetration movement of an indenter into a surface of a test specimen
CN104956211A Method and device for performing an X-ray fluorescence analysis
WO2013017292A1 Door arrester, in particular a door arrester for a fire door
DE102011103122A1 Spherical positioning cap for measuring probe for measuring thickness of thin layers, is provided with base body, where cylindrical core portion is arranged in pole cap
DE102011103123A1 Measuring probe for measuring thickness of thin layer in stationary device, has coil unit associated with outer face of housing, which is arranged facing spherical cap and is provided with disc-shaped support arranged with Archimedean coil
DE102010020116A1 Method and device for measuring the thickness of thin layers on large-area measuring surfaces
EP2189780A2 Device and method for measuring mechanical characteristics of materials