| # | Country | Total Patents | |
|---|---|---|---|
| #1 | WIPO (World Intellectual Property Organization) | 6 | |
| #2 | Canada | 2 | |
| #3 | United States | 2 | |
| #4 | EPO (European Patent Office) | 1 |
| # | Industry | |
|---|---|---|
| #1 | Electrical machinery and energy | |
| #2 | Measurement | |
| #3 | Semiconductors | |
| #4 | Micro-structure and nano-technology | |
| #5 | Machines | |
| #6 | Computer technology |
| # | Technology | |
|---|---|---|
| #1 | Electric discharge tubes | |
| #2 | Analysing materials | |
| #3 | Making microstructural devices | |
| #4 | Semiconductor devices | |
| #5 | Unspecified technologies | |
| #6 | Image data processing |
| # | Name | Total Patents |
|---|---|---|
| #1 | Lagarec Ken Guillaume | 11 |
| #2 | Phaneuf Michael William | 9 |
| #3 | Anderson Michael Anthony | 3 |
| #4 | Krechmer Alexander | 3 |
| #5 | Phaneuf Michael W | 2 |
| Publication | Filing date | Title |
|---|---|---|
| CA2835713A1 | Microscopy imaging method and system | |
| WO2008009139A1 | Method and system for counting secondary particles | |
| WO2007082380A1 | Redeposition technique for membrane attachment | |
| WO2007051312A1 | Apparatus and method for surface modification using charged particle beams |