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Designed asperity contactors, including nanospikes for semiconductor test, and associated systems and methods
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Translators coupleable to opposing surfaces of microelectronic substrates for testing, and associated systems and methods
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Wafer testing systems and associated methods of use and manufacture
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Maintaining a wafer/wafer translator pair in an attached state free of a gasket disposed therebetween
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Methods and apparatus for collecting process characterization data after first failure in a group of tested devices
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Wafer translator having metallization pattern providing high density interdigitated contact pads for component
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Wafer translator having a silicon core isolated from signal paths by a ground plane
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Wafer translator having a silicon core fabricated with printed circuit board manufacturing techniques
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Methods for access to a plurality of unsingulated integrated circuits of a wafer using single-sided edge-extended wafer translator
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Methods and apparatus for rotationally accessed tester interface
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Methods and apparatus for flexible extension of electrical conductors beyond the edges of a substrate
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Methods and apparatus for planar extension of electrical conductors beyond the edges of a substrate
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Apparatus for fixed-form multi-planar extension of electrical conductors beyond the margins of a substrate
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Apparatus for translated wafer stand-in tester
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Apparatus for full-wafer test and burn-in mechanism
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Methods for multi-modal wafer testing using edge-extended wafer translator
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Fiber-based optical alignment system
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Methods and apparatus for addition of electrical conductors to previously fabricated device
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