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ADVANCED INQUIRY SYSTEMS INC

Overview
  • Total Patents
    41
  • GoodIP Patent Rank
    222,682
About

ADVANCED INQUIRY SYSTEMS INC has a total of 41 patent applications. Its first patent ever was published in 2006. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and China. Its main competitors in its focus markets measurement, semiconductors and optics are TRANSLARITY INC, TECHWING CO LTD and CELERITY RES INC.

Patent filings in countries

World map showing ADVANCED INQUIRY SYSTEMS INCs patent filings in countries

Patent filings per year

Chart showing ADVANCED INQUIRY SYSTEMS INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Johnson Morgan T 39
#2 Durbin Aaron 7
#3 Keith David 5
#4 Preston Douglas A 3
#5 Werner Raymond J 2
#6 Santos Jose A 2
#7 Decher Peter H 1
#8 Whiteman Kenneth S 1
#9 Johnson Morgan 1
#10 Walls Lawrence H 1

Latest patents

Publication Filing date Title
US2014176174A1 Designed asperity contactors, including nanospikes for semiconductor test, and associated systems and methods
US2013265071A1 Translators coupleable to opposing surfaces of microelectronic substrates for testing, and associated systems and methods
WO2012054201A1 Wafer testing systems and associated methods of use and manufacture
US2011050274A1 Maintaining a wafer/wafer translator pair in an attached state free of a gasket disposed therebetween
US7786724B1 Methods and apparatus for collecting process characterization data after first failure in a group of tested devices
US2008231302A1 Wafer translator having metallization pattern providing high density interdigitated contact pads for component
US2009224372A1 Wafer translator having a silicon core isolated from signal paths by a ground plane
US2009224410A1 Wafer translator having a silicon core fabricated with printed circuit board manufacturing techniques
US2008048696A1 Methods for access to a plurality of unsingulated integrated circuits of a wafer using single-sided edge-extended wafer translator
US7498800B1 Methods and apparatus for rotationally accessed tester interface
US2008248663A1 Methods and apparatus for flexible extension of electrical conductors beyond the edges of a substrate
TW200811979A Methods and apparatus for planar extension of electrical conductors beyond the edges of a substrate
US2008001617A1 Apparatus for fixed-form multi-planar extension of electrical conductors beyond the margins of a substrate
US2008218192A1 Apparatus for translated wafer stand-in tester
US2008074135A1 Apparatus for full-wafer test and burn-in mechanism
US2007296449A1 Methods for multi-modal wafer testing using edge-extended wafer translator
US7379641B1 Fiber-based optical alignment system
US2006121648A1 Methods and apparatus for addition of electrical conductors to previously fabricated device