| # | Country | Total Patents | |
|---|---|---|---|
| #1 | WIPO (World Intellectual Property Organization) | 4 | |
| #2 | United States | 3 | |
| #3 | Taiwan | 2 | |
| #4 | China | 1 | |
| #5 | Republic of Korea | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Semiconductors | |
| #3 | Audio-visual technology |
| # | Technology | |
|---|---|---|
| #1 | Measuring electric variables | |
| #2 | Semiconductor devices | |
| #3 | Casings and printed circuits |
| # | Name | Total Patents |
|---|---|---|
| #1 | Cojocneanu Christian O | 8 |
| #2 | Scurtu Lucian | 8 |
| #3 | Iosub Doru G | 3 |
| #4 | Cojocneanu Christian | 3 |
| Publication | Filing date | Title |
|---|---|---|
| WO2020033335A1 | Apparatus and method for testing semiconductor devices | |
| CN110692129A | Apparatus and method for testing semiconductor device | |
| WO2009064285A1 | Apparatus and method for testing semiconductor devices | |
| TW200801545A | Apparatus and method for testing semiconductor devices | |
| US2007210811A1 | Apparatus having a member to receive a tray(s) that holds semiconductor devices for testing |