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X RAY OPTICAL SYS INC

Overview
  • Total Patents
    173
  • GoodIP Patent Rank
    135,708
  • Filing trend
    ⇩ 100.0%
About

X RAY OPTICAL SYS INC has a total of 173 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 1991. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and China. Its main competitors in its focus markets measurement, engines, pumps and turbines and electrical machinery and energy are X-RAY OPTICAL SYSTEMS INC, FREIBERGER PRAEZISIONSMECHANIK and BRUKER AXS GMBH.

Patent filings per year

Chart showing X RAY OPTICAL SYS INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Chen Zewu 94
#2 Gibson David M 32
#3 Radley Ian 26
#4 Moore Michael D 21
#5 Gallagher Brian W 20
#6 Bievenue Thomas J 19
#7 Burdett Jr John H 18
#8 Shakshober Stuart M 18
#9 Xin Kai 17
#10 Burdett John H 15

Latest patents

Publication Filing date Title
US2019056337A1 Sample handling apparatus for pressurized fluids and X-ray analyzer applications thereof
EP3149461A1 Active, variable sample concentration method and apparatus for sub-ppb measurements and exemplary x-ray analysis applications thereof
CN105247338A Non-homogeneous sample handling apparatus and X-ray analyzer applications thereof
CN104272424A X-ray analyzer having multiple excitation energy bands produced using multi-material x-ray tube anodes and monochromating optics
CN104272095A Portable x-ray analyzer having vibration, thermal and/or moisture isolation from exterior environment
CN103765201A Support structure and highly aligned monochromating x-ray optics for x-ray analysis engines and analyzers
WO2013052556A2 Mobile transport and shielding apparatus for removable x-ray analyzer
CN110006936A The on-line monitoring of pollutant and its refinery's application in crude oil and heavy fuel
CN103119841A Compact, low noise power supply for advanced electronics applications, and x-ray analyzer applications thereof
CN102792157A Sample module with sample stream supported and spaced from window, for x-ray analysis system
US2009225948A1 Highly aligned x-ray optic and source assembly for precision x-ray analysis applications
CN101981651A XRF system having multiple excitation energy bands in highly aligned package
WO2009108628A2 Sample module with sample stream spaced from window, for x-ray analysis system
US2009141862A1 Sliding sample cell insertion and removal apparatus for x-ray analyzer
US2009141865A1 Shielded sample cell insertion and removal apparatus for X-ray analyzer
EP2223091A1 Pre-filmed precision sample cell for x-ray analyzer
CN101883980A Small spot and high energy resolution XRF system for valence state determination
CN101558454A X-ray focusing optic having multiple layers with respective crystal orientations
US2008159479A1 Wide parallel beam diffraction imaging method and system
US2007140420A1 X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof