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RIGAKU IND CORP

Overview
  • Total Patents
    445
About

RIGAKU IND CORP has a total of 445 patent applications. Its first patent ever was published in 1979. It filed its patents most often in Japan, United States and Germany. Its main competitors in its focus markets measurement, engines, pumps and turbines and micro-structure and nano-technology are FREIBERGER PRAEZISIONSMECHANIK, KATZ ELISABETH and KRATKY OTTO DR DR E H.

Patent filings per year

Chart showing RIGAKU IND CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kataoka Yoshiyuki 53
#2 Kawahara Naoki 35
#3 Shoji Takashi 30
#4 Yamada Takashi 29
#5 Kono Hisamasa 29
#6 Yamagami Motoyuki 27
#7 Inoue Minoru 22
#8 Shimizu Kazuaki 22
#9 Kamata Shigeo 22
#10 Sumii Hiroshi 20

Latest patents

Publication Filing date Title
JP2009053037A Fluorescent x-ray analyzer
JP2009053036A Sample drier
JP2009033822A Controller for pulse motor, fluorescent x-ray analyzer provided therewith and program for controlling pulse motor
JP2009025262A X-ray analyzer
JP2008032703A X-ray fluorescence analyzer
WO2008004344A1 Fluorescent x-ray analyzer
JP2008058300A Sample holder and oblique-incidence fluorescent x-ray analyzer
JP2008304405A Fluorescent x-ray analyzer and method for the same
JP2008298679A Fluorescent x-ray analysis apparatus and its method
JP2008058296A Total reflection fluorescent x-ray analyzer
JP2008128925A Different-shape sample holder for underface irradiation fluorescent x-ray analysis, and underface irradiation type fluorescence x-ray spectrometer equipped therewith
JP2008122144A Specimen drip substrate for total-reflection fluorescence x-ray analysis, total reflection fluorescent x-ray analyzer, and total reflection fluorescent x-ray analysis method
JP2007139754A Fluorescence x-ray spectrometer, and program used therefor
JP2008058076A Fluorescent x-ray analyzer and fluorescent x-ray analyzing method
JP2008039717A Thin-film sample cutter for analysis and fluorescent x-ray analyzing method using it
JP2007108165A X-ray fluorescence spectrometer
JP2007285791A Concave x-ray spectral element, method for manufacturing the same and x-ray analyzer using the same
JP2007278965A Fluorescent x-ray analyzer
JP2007240335A Safety mechanism of on-off lid and analyzer having it
JP2006184289A Spectroscopic element attaching mechanism