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JAPAN SYNCHROTRON RADIATION RESEARCH INST

Overview
  • Total Patents
    44
  • GoodIP Patent Rank
    208,615
About

JAPAN SYNCHROTRON RADIATION RESEARCH INST has a total of 44 patent applications. Its first patent ever was published in 1999. It filed its patents most often in Japan, United States and EPO (European Patent Office). Its main competitors in its focus markets measurement, civil engineering and optics are FREIBERGER PRAEZISIONSMECHANIK, RIGAKU IND CORP and X-RAY OPTICAL SYSTEMS INC.

Patent filings in countries

World map showing JAPAN SYNCHROTRON RADIATION RESEARCH INSTs patent filings in countries
# Country Total Patents
#1 Japan 39
#2 United States 3
#3 EPO (European Patent Office) 1
#4 Republic of Korea 1

Patent filings per year

Chart showing JAPAN SYNCHROTRON RADIATION RESEARCH INSTs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Sakata Osami 9
#2 Takada Masaki 5
#3 Tomizawa Hiromitsu 5
#4 Sakata Makoto 3
#5 Yasumoto Masato 3
#6 Nishibori Eiji 3
#7 Fujinawa Takeshi 2
#8 Matsushita Tomohiro 2
#9 Harada Jimpei 2
#10 Kamijo Osao 2

Latest patents

Publication Filing date Title
JP2015220014A Magnetic field generation device comprising magnetic field variation mechanism for arbitrarily changing magnetic field at magnetic field generation position, and magnetic field adjustment method
JP2015215209A Sample cell for x-ray absorption fine structure transmission measurement
JP2010117365A Structure factor tensor element determination method, and x-ray diffraction device utilization method therefor
JP2010105028A Method and apparatus for microprocessing cyano crosslinked metal complex
JP2010015877A Electron gun, electron microscope, and electron generation method
JP2009175020A Beam stop with built-in optical sensor supported by film having conductive layer
JP2009031634A Pulse shaping device, pulse shaping method, and electron gun
JP2009023892A Physical property microprocessing method and physical property microprocessing apparatus
JP2008288087A Beam measuring device, beam measuring method, and pump/probe measuring method using the device
JP2008243671A Etching method of acceleration cavity
JP2007223886A Method and material for implementing dielectric characteristic by distributing electron density in material to dipole type
JP2007249059A Light intensity distribution shaping device
JP2007241950A Highly accurate clock trigger continuous delay device
KR20070054069A Method of implementing dielectric characteristic by distributing electron density in material to dipole type
JP2007183142A High heat resistance/high speed emitted light monitor
JP2007080697A Photoelectric transfer element and electron beam generator using it
JP2007003375A Method of finding experimentally electrostatic potential by mem structural analysis of x-ray diffraction data of crystal substance
US2006032433A1 Rapid X-ray diffraction method for structural analysis of a nano material on a surface or at an interface and for structural analysis of a solid/liquid interface, and apparatus used for the method
JP2006292661A Rapid x-ray structure analyzer for ultrafine structure
JP2006284187A Rapid structure analyzing method by x-ray for interfacial structure of solution and solid