Learn more

RIGAKU DENKI CO LTD

Overview
  • Total Patents
    1,877
  • GoodIP Patent Rank
    3,531
  • Filing trend
    ⇩ 1.0%
About

RIGAKU DENKI CO LTD has a total of 1,877 patent applications. It decreased the IP activity by 1.0%. Its first patent ever was published in 1967. It filed its patents most often in Japan, United States and EPO (European Patent Office). Its main competitors in its focus markets measurement, engines, pumps and turbines and electrical machinery and energy are BRUKER AXS INC, PANALYTICAL BV and MALVERN PANALYTICAL BV.

Patent filings per year

Chart showing RIGAKU DENKI CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Omote Kazuhiko 175
#2 Kuribayashi Masaru 62
#3 Ito Yoshiyasu 57
#4 Ozawa Tetsuya 57
#5 Kikuchi Tetsuo 57
#6 Doshiyou Akihide 53
#7 Sakumura Takuto 53
#8 Arii Tadashi 51
#9 Osaka Naohisa 45
#10 Kataoka Yoshiyuki 44

Latest patents

Publication Filing date Title
EP3812797A1 Processing apparatus, system, x-ray measurement method, and program
US2021102908A1 X-ray measurement apparatus and system
KR20210020794A Sample holding device for x-ray analysis
WO2021053941A1 Quantitative analysis method, quantitative analysis program, and fluorescence x-ray analysis device
WO2021059597A1 X-ray fluorescence analyzer
WO2021038943A1 Structure for battery analysis and x-ray diffraction device
WO2020194986A1 Transmissive small-angle scattering device
WO2020105716A1 Single-crystal x-ray structural analysis device and method, and sample holder therefor
WO2020105718A1 Single-crystal x-ray structural analysis system
WO2020105725A1 Single-crystal x-ray structural analysis sample occlusion device and occlusion method
WO2020105724A1 Single-crystal x-ray structural analysis device and sample holder
WO2020105727A1 Sample holder unit for single-crystal x-ray structural analysis devices
WO2020105723A1 Single-crystal x-ray structural analysis sample occlusion device and occlusion method
WO2020105728A1 Sample holder unit for single-crystal x-ray structural analysis devices
WO2020105721A1 Single-crystal x-ray structural analysis device and method, and sample holder and applicator therefor
WO2020105722A1 Single-crystal x-ray structural analysis device and method therefor
WO2020105726A1 Single-crystal x-ray structural analysis device sample holder, sample holder unit, and occlusion method
WO2020105720A1 Single-crystal x-ray structural analysis device and sample holder mounting device
WO2020105717A1 Single-crystal x-ray structural analysis device and method, and sample holder unit therefor
KR20210028608A Fluorescence X-ray analysis device