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BRUKER AXS GMBH

Overview
  • Total Patents
    135
  • GoodIP Patent Rank
    32,964
  • Filing trend
    ⇩ 30.0%
About

BRUKER AXS GMBH has a total of 135 patent applications. It decreased the IP activity by 30.0%. Its first patent ever was published in 1998. It filed its patents most often in EPO (European Patent Office), United States and Germany. Its main competitors in its focus markets measurement, engines, pumps and turbines and electrical machinery and energy are X-RAY OPTICAL SYSTEMS INC, JORDAN VALLEY SEMICONDUCTORS LTD and RIGAKU C0RPORATION.

Patent filings in countries

World map showing BRUKER AXS GMBHs patent filings in countries

Patent filings per year

Chart showing BRUKER AXS GMBHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Lange Joachim 16
#2 Ollinger Christoph 14
#3 Bruegemann Lutz 10
#4 Kuhnmuench Norbert 10
#5 Bahr Detlef 9
#6 Golenhofen Rainer 8
#7 Michaelsen Carsten 8
#8 Vigliante Assunta 7
#9 Filsinger Frank 6
#10 Gehrlein Wolfgang 6

Latest patents

Publication Filing date Title
WO2020165800A2 Graphene encapsulation of biological molecules for single molecule imaging
DE102019209188A1 Measurement arrangement for X-rays with reduced parallax effects
DE102019208834B3 Device for adjusting and changing beam catchers
DE102019202442A1 Measurement arrangement for X-rays for a gap-free 1D measurement
US2020135424A1 Electron diffraction imaging system for determining molecular structure and conformation
DE102017223228B3 Setup for spatially resolved measurement with a wavelength-dispersive X-ray spectrometer
US2019170670A1 X-ray source using electron impact excitation of high velocity liquid metal beam
DE102017221719A1 OPTICAL EMISSION SPECTROMETER WITH CASCADED LOAD MEMORIES
US2019057832A1 Analytical X-ray tube with high thermal performance
DE102016224940B3 X-ray device with motor torque compensation at the detector circuit of the goniometer and method for operating an X-ray device
DE102016210304B3 Measuring chamber for a compact goniometer in an X-ray spectrometer
DE102016208320B3 Device for sorting materials, in particular scrap particles, by means of X-ray fluorescence
DE102015226101A1 X-ray optics assembly with switching system for three beam paths and associated X-ray diffractometer
EP2778665A1 X-ray analyzing system for x-ray scattering analysis
EP2762862A1 XRF measurement apparatus for detecting contaminations on the bevel of a wafer
US2014161233A1 X-ray apparatus with deflectable electron beam
EP2643688A1 Device and method for combustion analysis by means of induction furnaces
WO2012079800A1 Method and arrangement for characterizing fat bloom and quality of chocolate containing surfaces by x-ray diffraction
EP2534472A1 A system for analyzing a granulate for producing a pharmaceutical product
DE102010062472A1 Dot-dash Converter