Learn more

WUHAN JINGHONG ELECTRONIC TECH CO LTD

Overview
  • Total Patents
    25
  • GoodIP Patent Rank
    64,038
About

WUHAN JINGHONG ELECTRONIC TECH CO LTD has a total of 25 patent applications. Its first patent ever was published in 2018. It filed its patents most often in China. Its main competitors in its focus markets computer technology, measurement and electrical machinery and energy are CHENG WU-TUNG, ONE TEST SYSTEMS and KINGTIGER TECHNOLOGY CANADA INC.

Patent filings in countries

World map showing WUHAN JINGHONG ELECTRONIC TECH CO LTDs patent filings in countries
# Country Total Patents
#1 China 25

Patent filings per year

Chart showing WUHAN JINGHONG ELECTRONIC TECH CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Deng Biaohua 22
#2 Pei Jing 11
#3 Du Jian 10
#4 Cao Rui 4
#5 Zhang Qingxun 3
#6 Zhou Xuan 3
#7 Zhang Fu 3
#8 Chen Kai 3
#9 Meng Yang 3
#10 Liu Hai 2

Latest patents

Publication Filing date Title
CN111930386A PATTERN file compiling method and device and electronic equipment
CN111830401A Semiconductor test equipment
CN111751699A Semiconductor memory aging test system, test method and development method
CN111739575A Storage chip quality detection method, device, equipment and readable storage medium
CN111489785A Heat dissipation and air supply device for aging test board card in semiconductor memory aging test equipment
CN111289880A High-low temperature incubator for batch test of semiconductor chips
CN111370050A Diagnostic calibration system and method for test equipment
CN111308305A Semiconductor test equipment
CN111289878A Heat insulation cavity and aging test equipment
CN111289877A Aging test equipment
CN111413522A Jig for plugging and unplugging connector and test equipment comprising same
CN110954806A Gas path structure supporting high-temperature aging test and operation method thereof
CN111124373A Test software development method and device and test equipment
CN111179997A Method and device for storing test data of semiconductor memory
CN109406916A A kind of test platform for semiconductor memory ageing tester
CN109411007A A kind of Common Flash Memory test macro based on FPGA
CN109660386A A kind of semiconductor memory aging testing system method for upgrading software
CN109327141A A kind of wide-range voltage and High-current output method and power-supply system
CN109257230A A kind of Log Administration System and method of semiconductor memory burn-in test
CN109143045A A kind of timing and waveform generating and method