System and method for testing and identifying memory devices
US2015363309A1
System and method of increasing reliability of non-volatile memory storage
CN104979017A
Systems and methods for testing and assembling memory modules
US2014211580A1
Systems and methods for testing and assembling memory modules
US2014068360A1
Systems and methods for testing memory
TW201224481A
Determining data valid windows in a system and method for testing an integrated circuit device
US2011179324A1
Testing apparatus and method for analyzing a memory module operating within an application system
US2009306925A1
Systems and methods for testing integrated circuit devices
TW200921127A
System and method for testing integrated circuit modules comprising a plurality of integrated circuit devices
TW200846690A
Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels
