| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Republic of Korea | 10 | |
| #2 | China | 2 |
| # | Industry | |
|---|---|---|
| #1 | Machines | |
| #2 | Measurement | |
| #3 | Semiconductors | |
| #4 | Optics | |
| #5 | Audio-visual technology | |
| #6 | Surface technology and coating | |
| #7 | Machine tools |
| # | Name | Total Patents |
|---|---|---|
| #1 | Karasawa Wataru | 2 |
| #2 | Akimoto Masami | 2 |
| #3 | Kimura Yoshio | 2 |
| #4 | Hirakawa Osamu | 2 |
| #5 | Anai Noriyuki | 2 |
| #6 | Uchida Takuo | 1 |
| #7 | Asakawa Eiji | 1 |
| #8 | Matsumura Goji | 1 |
| #9 | Mochijuki Wataru | 1 |
| #10 | Yosioka Gazdosi | 1 |
| Publication | Filing date | Title |
|---|---|---|
| KR960009583B1 | Lcd probe device having alignment function and fitting method for installation for lcd device | |
| KR960006869B1 | Method of testing electrical characteristics of lcd with probe device | |
| KR960010067B1 | Apparatus for turning over | |
| KR960010066B1 | Electrical characteristic measuring apparatus | |
| KR960008894B1 | Ashing method |