| # | Country | Total Patents | |
|---|---|---|---|
| #1 | China | 4 | |
| #2 | Republic of Korea | 4 | |
| #3 | Taiwan | 4 | |
| #4 | WIPO (World Intellectual Property Organization) | 4 | |
| #5 | EPO (European Patent Office) | 3 | |
| #6 | United States | 3 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Semiconductors | |
| #3 | Audio-visual technology | |
| #4 | Electrical machinery and energy |
| # | Technology | |
|---|---|---|
| #1 | Semiconductor devices | |
| #2 | Measuring electric variables | |
| #3 | Measuring light | |
| #4 | Display controls | |
| #5 | Special electric heating or lighting | |
| #6 | Analysing materials |
| # | Name | Total Patents |
|---|---|---|
| #1 | Henley Francois J | 18 |
| #2 | Henley Francois J (Joseph) | 4 |
| Publication | Filing date | Title |
|---|---|---|
| TW201917811A | Light emitting diode (LED) mass-transfer apparatus and method of manufacture | |
| CN110945637A | Light Emitting Diode (LED) testing apparatus and method of manufacture | |
| WO2018136970A1 | Light emitting diode (led) test apparatus and method of manufacture | |
| CN110337712A | Light emitting diode (LED) test equipment and manufacturing method |