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PAGANI ALBERTO

Overview
  • Total Patents
    24
  • GoodIP Patent Rank
    235,163
  • Filing trend
    ⇩ 100.0%
About

PAGANI ALBERTO has a total of 24 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2008. It filed its patents most often in United States and Italy. Its main competitors in its focus markets measurement, semiconductors and telecommunications are MCI COMPUTER GMBH, KANKYO DENJI GIJUTSU KENKYUSHO and SECRON CO LTD.

Patent filings in countries

World map showing PAGANI ALBERTOs patent filings in countries
# Country Total Patents
#1 United States 23
#2 Italy 1

Patent filings per year

Chart showing PAGANI ALBERTOs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Pagani Alberto 24
#2 Girlando Giovanni 2
#3 Finocchiaro Alessandro 2
#4 Bard Jean-Michel 1
#5 Murari Bruno 1

Latest patents

Publication Filing date Title
US2013027073A1 Integrated circuit comprising at least an integrated antenna
US2013026466A1 Testing architecture of circuits integrated on a wafer
US2012025344A1 Traceable integrated circuits and production method thereof
US2012068725A1 Sensing structure of alignment of a probe for testing integrated circuits
US2011279137A1 Probes for testing integrated electronic circuits and corresponding production method
US2011278568A1 Probe pad with indentation
US2011267086A1 Test circuit of an integrated circuit on a wafer
US2011205028A1 Electronic communications device with antenna and electromagnetic shield
US2013057312A1 System and method for electrical testing of through silicon vias (TSVs)
US2011202799A1 Process for making an electric testing of electronic devices
US2011156732A1 Process for controlling the correct positioning of test probes on terminations of electronic devices integrated on a semiconductor and corresponding electronic device
US2011090030A1 Signal transmission through LC resonant circuits
US2011050267A1 Electromagnetic shield for testing integrated circuits
US2010164526A1 MEMS probe for probe cards for integrated circuits
US2010134133A1 Method for performing an electrical testing of electronic devices