SCANIMETRICS INC has a total of 35 patent applications. Its first patent ever was published in 2002. It filed its patents most often in United States, Canada and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, telecommunications and semiconductors are TOHOKU SEIKI IND, NANONEXUS INC and SHANGHAI RES INST OF MICROELECTRONICS PEKING UNIVERSITY.
# | Country | Total Patents | |
---|---|---|---|
#1 | United States | 8 | |
#2 | Canada | 6 | |
#3 | WIPO (World Intellectual Property Organization) | 5 | |
#4 | United Kingdom | 4 | |
#5 | China | 3 | |
#6 | EPO (European Patent Office) | 3 | |
#7 | Republic of Korea | 3 | |
#8 | Japan | 2 | |
#9 | Taiwan | 1 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Telecommunications | |
#3 | Semiconductors | |
#4 | Electrical machinery and energy | |
#5 | Audio-visual technology | |
#6 | Optics |
# | Technology | |
---|---|---|
#1 | Measuring electric variables | |
#2 | Semiconductor devices | |
#3 | Transmission systems | |
#4 | Transmission | |
#5 | Magnets and transformers | |
#6 | Nonlinear optics | |
#7 | Display controls | |
#8 | Selecting | |
#9 | Special measuring | |
#10 | Measuring length, angles and areas |
# | Name | Total Patents |
---|---|---|
#1 | Slupsky Steven | 23 |
#2 | Moore Brian | 22 |
#3 | Sellathamby Christopher V | 17 |
#4 | Sellathamby Christopher | 8 |
#5 | Slupsky Steven Harold | 4 |
#6 | Brian Moore | 4 |
#7 | Steven Slupsky | 3 |
#8 | Decorby Raymond George | 3 |
#9 | Slupsky Steven H | 2 |
#10 | Sellatmamby Christopher V | 1 |
Publication | Filing date | Title |
---|---|---|
WO2017096489A1 | Measuring and monitoring a body of granular material | |
CA2890971A1 | Containment integrity sensor device | |
CA2820585A1 | Wireless sensor device | |
US2011254123A1 | Ultra high speed signal transmission/reception | |
GB0919482D0 | Ultra high speed signal transmission/reception | |
CN101680914A | Use the test of the electronic circuit of active probe integrated circuit | |
CA2623257A1 | Method and apparatus for interrogating an electronic component | |
GB0900969D0 | Thin film transistor array having test circuitry | |
KR20090015895A | Method and apparatus for interrogating an electronic component | |
CA2404183A1 | Non-contact tester for integrated circuits |