| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Japan | 37 | |
| #2 | Republic of Korea | 1 |
| # | Industry | |
|---|---|---|
| #1 | Audio-visual technology | |
| #2 | Semiconductors |
| # | Technology | |
|---|---|---|
| #1 | Semiconductor devices | |
| #2 | Casings and printed circuits |
| # | Name | Total Patents |
|---|---|---|
| #1 | Osada Atsushi | 7 |
| #2 | Kobayashi Kazuyoshi | 6 |
| #3 | Sugino Susumu | 5 |
| #4 | Abe Yasuji | 4 |
| #5 | Uchida Mizuki | 3 |
| #6 | Nakagome Tatsuya | 3 |
| #7 | Ueno Nobuo | 2 |
| #8 | Nakada Tsutomu | 2 |
| #9 | Mochizuki Masahiko | 2 |
| #10 | Kurashina Yasuhisa | 2 |
| Publication | Filing date | Title |
|---|---|---|
| JPH04207047A | Inspection apparatus | |
| JPH04186855A | Probing equipment | |
| JPH0465888A | Electronic circuit device | |
| JPH0465851A | Inspection equipment | |
| JPH0438847A | Wafer prober | |
| JPH03205841A | Assembling apparatus for probe card | |
| JPH03205842A | Probe card device | |
| JPH0393250A | Transfer apparatus | |
| JPH0370154A | Transfer method | |
| JPH02224262A | Processing method | |
| JPH02259719A | Apparatus for producing liquid crystal substrate | |
| JPH02259720A | Treating device | |
| JPH02184045A | Rearranging method | |
| JPH02184044A | Wafer transfer method | |
| JPH02156161A | Probing apparatus | |
| JPH02126649A | Transfer apparatus | |
| JPH02122245A | Instrument for measuring concentration of ozone | |
| KR0133679B1 | Treatment apparatus | |
| JPH01243415A | Processing equipment | |
| JPH01230245A | Transfer apparatus |