Method for determination of electrical properties of electronic componets and method for calibration of a measuring unit
DE102009008320A1
Method for measurement of impedances, and dielectric and permeable characteristics of biological samples, involves determining reflection or transmission behavior of sample arranged in sample support
DE102009005182A1
Chuck and method for holding and holding thin test substrates
KR20100105541A
Probe holder
KR20100037273A
Method and arrangement for positioning a probe card
KR20100111266A
Method for testing a test substrate under defined thermal conditions and thermally conditionable prober
DE102008047337A1
Method and device for testing a test substrate in a prober under defined thermal conditions
DE102008038186A1
Probe for the temporary electrical contacting of a solar cell
DE102008038184A1
Method and device for the temporary electrical contacting of a solar cell
DE102008033903A1
Device and method for mounting a plurality of semiconductor devices on a target substrate
DE102008031354A1
Electronic component i.e. wafer, contacting method for e.g. measuring parameter, involves arranging components on substrate, where one selected component is contacted across contact surface on rear side lying opposite to front side
DE102008029380A1
Electronic circuit i.e. foil component, testing device for use on foil web, has foil webs movable to each other in area of holding device and sample unit, and unwinding and winding devices provided with intermittent drive
JP2008272931A
Device and method for controlling motion device
DE102008013978A1
Chuck with triaxial construction
US2008195344A1
Method for determining measurement errors in scattering parameter measurements
DE102008007603A1
Method and device for better utilization of semiconductor material
US2009049944A1
Micromanipulator for moving a probe
JP2008167447A
Arrangement and method for image acquisition on prober
DE102007063298A1
Multilevel-image acquisition focusing arrangement for use in prober, has lens provided on surface of object independent of drive of microscope in focus plane, and another focus plane lying in height of tip and focusing lens focusing system
DE102007063299A1
Arrangement for image recording at specimen, has movement device, clapping device arranged on movement device for test object, where sensor needle contacts test object
