Learn more

FORMFACTOR BEAVERTON INC

Overview
  • Total Patents
    34
  • GoodIP Patent Rank
    46,646
  • Filing trend
    ⇧ 133.0%
About

FORMFACTOR BEAVERTON INC has a total of 34 patent applications. It increased the IP activity by 133.0%. Its first patent ever was published in 2013. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and EPO (European Patent Office). Its main competitors in its focus markets measurement, semiconductors and computer technology are SEMICONDUCTOR DIAGNOSTICS INC, SOLID STATE MEASUREMENTS INC and TF EA INC.

Patent filings per year

Chart showing FORMFACTOR BEAVERTON INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Negishi Kazuki 18
#2 Frankel Joseph George 10
#3 Duckworth Koby L 6
#4 Frankel Joseph 5
#5 Fisher Gavin Neil 5
#6 Christenson Eric Robert 4
#7 Simmons Michael E 4
#8 Storm Christopher 4
#9 Giessmann Sebastian 3
#10 Teich Michael 3

Latest patents

Publication Filing date Title
WO2021066911A1 Maintaining gap spacing between an optical probe and an optical device of a device under test
US2021096175A1 Methods for maintaining gap spacing between an optical probe of a probe system and an optical device of a device under test, and probe systems that perform the methods
US2020378888A1 Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems
US2020241278A1 Microscopes with objective assembly crash detection and methods of utilizing the same
US2020217638A1 Probe systems and methods for calibrating capacitive height sensing measurements
US2020025823A1 Probe systems and methods that utilize a flow-regulating structure for improved collection of an optical image of a device under test
US2019369141A1 Probe stations for testing a device under test and associated methods
US2019227102A1 Probes with fiducial targets, probe systems including the same, and associated methods
US2019157326A1 Method and device for optically representing electronic semiconductor components
US2019101567A1 Probe systems for testing a device under test