SPECS SURFACE NANO ANALYSIS GMBH has a total of 21 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2009. It filed its patents most often in EPO (European Patent Office), China and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, electrical machinery and energy and micro-structure and nano-technology are CAMECA, AKTSIONERNOE OBSHCHESTVO NAUCHNO PROIZVODSTVENNOE PREDPRIYATIE ALMAZ AO NPP ALMAZ and BRUKER DALTONICS INC.
# | Country | Total Patents | |
---|---|---|---|
#1 | EPO (European Patent Office) | 5 | |
#2 | China | 4 | |
#3 | WIPO (World Intellectual Property Organization) | 4 | |
#4 | Germany | 2 | |
#5 | Republic of Korea | 2 | |
#6 | Hong Kong | 1 | |
#7 | Japan | 1 | |
#8 | Taiwan | 1 | |
#9 | United States | 1 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Electrical machinery and energy | |
#3 | Micro-structure and nano-technology |
# | Technology | |
---|---|---|
#1 | Electric discharge tubes | |
#2 | Analysing materials | |
#3 | Scanning-probe techniques | |
#4 | Measuring electric variables | |
#5 | Nanostructure applications |
# | Name | Total Patents |
---|---|---|
#1 | Schaff Oliver | 13 |
#2 | Kampen Thorsten | 8 |
#3 | Kunze Kai | 3 |
#4 | Thissen Andreas | 3 |
#5 | Funnemann Dietmar | 3 |
#6 | Breitschaft Martin | 3 |
#7 | Hagen Sebastian | 3 |
#8 | Johansson Martin | 3 |
#9 | Schönhense Gerd | 2 |
#10 | Laegsgaard Erik | 2 |
Publication | Filing date | Title |
---|---|---|
DE102019107327A1 | Apparatus and method for electron transfer from a sample to an energy analyzer and electron spectrometer apparatus | |
DE102016116765B3 | Device with particle-optical lens effect for the investigation of a non-gaseous sample in a gaseous environment, electron and / or ion-optical system and method for testing | |
KR20140025315A | Spin detector arrangement for measuring the vector component of a spin vector predominating in a particle beam | |
EP2312326A1 | Mount for a scanning probe sensor package, scanning probe microscope and method of mounting or dismounting a scanning probe sensor package. | |
EP2282217A1 | Metal tip for scanning probe applications and method of producing the same |