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INTEGRATED CIRCUIT TESTING

Overview
  • Total Patents
    324
  • GoodIP Patent Rank
    85,842
About

INTEGRATED CIRCUIT TESTING has a total of 324 patent applications. Its first patent ever was published in 1979. It filed its patents most often in EPO (European Patent Office), United States and Japan. Its main competitors in its focus markets electrical machinery and energy, micro-structure and nano-technology and measurement are ALIS CORP, COMPLETE SUBSTRATE SOLUTIONS L and PREIKSZAS DIRK.

Patent filings per year

Chart showing INTEGRATED CIRCUIT TESTINGs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Adamec Pavel 87
#2 Frosien Juergen 86
#3 Winkler Dieter 57
#4 Lanio Stefan 46
#5 Feuerbaum Hans-Peter 30
#6 Degenhardt Ralf 23
#7 Banzhof Helmut 16
#8 Frosien Jürgen 15
#9 Zhou Fang 15
#10 Munack Harry 13

Latest patents

Publication Filing date Title
US9349566B1 Charged particle beam device, beam deflector device and methods of operating thereof
US9330884B1 Dome detection for charged particle beam device
US9245709B1 Charged particle beam specimen inspection system and method for operation thereof
US9202666B1 Method for operating a charged particle beam device with adjustable landing energies
EP2816585A1 Charged particle beam system and method of operating thereof
EP2801997A1 Electron beam wafer inspection system and method for operation thereof
EP2779201A1 High brightness electron gun, system using the same, and method of operating the same
EP2779204A1 Electron gun arrangement
EP2747121A1 Secondary electron optics & detection device
EP2682978A1 Contamination reduction electrode for particle detector
EP2665082A1 Element for fast magnetic beam deflection
EP2654069A1 Multi channel detector, optics therefore and method of operating thereof
EP2629317A1 Charged particle beam device with dynamic focus and method of operating thereof
EP2592314A1 Charged particle beam device, vacuum valve therefore and operation thereof
EP2551889A1 Charged particle beam apparatus with shielding member having a charge control electrode
EP2511939A1 Arrangement and method for the contrast improvement in a charged particle beam device for inspecting a specimen
EP2444990A1 Simplified particle emitter and method of operating thereof
JP2011091036A Achromatic beam deflector, achromatic beam separator, charged particle device, method of operating achromatic beam deflector, and method of operating achromatic beam separator
EP2418672A1 Multi-axis lens, beam system making use of the compound lens, and method of manufacturing the compound lens
EP2405460A1 Electron beam device with tilting and dispersion compensation, and method of operating same