Learn more

CAMECA

Overview
  • Total Patents
    101
About

CAMECA has a total of 101 patent applications. Its first patent ever was published in 1965. It filed its patents most often in France, EPO (European Patent Office) and United States. Its main competitors in its focus markets electrical machinery and energy, measurement and optics are CEBT CO LTD, ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH and MELBIL CO LTD.

Patent filings per year

Chart showing CAMECAs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Rasser Bernard 12
#2 De Chambost Emmanuel 10
#3 Bostel Alain 9
#4 Slodzian Georges 7
#5 Deconihout Bernard 6
#6 Vurpillot Francois 5
#7 Tong Mathias 5
#8 Rouberol Jean-Michel 5
#9 Yavor Mikhail 5
#10 Monsallut Pierre 5

Latest patents

Publication Filing date Title
EP2351218A1 Tomography atomic probe comprising a high voltage electric pulse electro-optical generator
WO2010000574A2 Device for generating wide spectral band laser pulses, particularly for a tomographic atom probe
FR2942349A1 Wide angular acceptance mass analysis device comprising a reflectron
FR2942072A1 Achromatic magnetic mass spectrometer with double focusing.
FR2941087A1 Atomic wave-time mass spectrometer tomographic probe incorporating an electrostatic device
EP2198449A1 Wide angle high resolution atom probe
FR2924269A1 Atomic probe with high acceptance
FR2837931A1 DEVICE FOR MEASURING THE X-RAY EMISSION PRODUCED BY AN OBJECT SUBJECT TO AN ELECTRON BEAM
FR2776061A1 Method and device for measuring crater bottoms in a physico-chemical analyzer
EP0692812A1 Magnetic wedge for active aberration correction in a massspectrometer
FR2678425A1 METHOD FOR ENHANCING THE EMISSION OF POSITIVE SECONDARY IONS IN OXIDIZED MATRICES.
FR2675631A1 DEVICE FOR MULTICOLLECTION OF PARTICLES ON THE MASS PLAN OF AN ELECTRICALLY CHARGED PARTICLE DISPERSION APPARATUS.
FR2666171A1 High transmission stigma mass spectrometer.
FR2644930A1 Variable focal composite electromagnetic lens
FR2624610A1 Time-of-flight, continuously scan analysis method and analysis device for carrying out said method
FR2620532A1 Method for analyzing a sample by erosion using a particle beam, and device for carrying out said method
FR2602051A1 Method and device for discharge of insulating samples during ion analysis
FR2584234A1 Integrated circuit tester with electron beam
FR2582860A1 System for the automatic continuous insertion of filaments inside the source of a thermoionized mass spectrometer
US4564758A Process and device for the ionic analysis of an insulating sample