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SHENZHEN NANOLIGHTING LAB LTD

Overview
  • Total Patents
    22
  • GoodIP Patent Rank
    73,781
About

SHENZHEN NANOLIGHTING LAB LTD has a total of 22 patent applications. Its first patent ever was published in 2018. It filed its patents most often in China. Its main competitors in its focus markets measurement, computer technology and semiconductors are HSEB DRESDEN GMBH, QNESS GMBH and HAMAMATSU AKIRA.

Patent filings in countries

World map showing SHENZHEN NANOLIGHTING LAB LTDs patent filings in countries
# Country Total Patents
#1 China 22

Patent filings per year

Chart showing SHENZHEN NANOLIGHTING LAB LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Chen Lu 22
#2 Li Qinggele 9
#3 Zhang Song 8
#4 Lyu Su 6
#5 Wang Tianmin 5
#6 Huang Youwei 5
#7 Zhang Pengbin 4
#8 Jiang Bowen 4
#9 Fang Yi 4
#10 Cui Gaozeng 3

Latest patents

Publication Filing date Title
CN111987029A Substrate conveying device and working method thereof, substrate processing system and processing method
CN111812099A Detection device and detection method
CN111721781A Detection equipment and detection method thereof
CN111812100A Detection device and detection method
CN111554609A Bearing device and use method thereof
CN111508932A Overlay mark and overlay error measuring method
CN111323371A Optical detection system and optical detection method
CN111220626A Bearing device, bearing method and detection equipment
CN111239047A Optical equipment and method for realizing automatic focusing
CN111122586A Processing machine and processing method thereof
CN110542392A Detection equipment and detection method
CN112013784A Detection method and detection system
CN111754385A Data point model processing method and system, detection method and system and readable medium
CN111724335A Detection method and detection system
CN111563870A Image processing method and apparatus, detection method and apparatus, and storage medium
CN111458343A Detection device and detection method
CN111323433A Detection device and detection method thereof
CN111325707A Image processing method and system, and detection method and system
CN111220088A Measurement system and method
CN111198192A Detection device and detection method