HSEB DRESDEN GMBH has a total of 38 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2009. It filed its patents most often in Germany, WIPO (World Intellectual Property Organization) and United States. Its main competitors in its focus markets measurement, computer technology and optics are SHENZHEN NANOLIGHTING LAB LTD, QNESS GMBH and MYTHOS.
# | Country | Total Patents | |
---|---|---|---|
#1 | Germany | 12 | |
#2 | WIPO (World Intellectual Property Organization) | 11 | |
#3 | United States | 7 | |
#4 | EPO (European Patent Office) | 5 | |
#5 | Hungary | 1 | |
#6 | Republic of Korea | 1 | |
#7 | Lithuania | 1 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Computer technology | |
#3 | Optics | |
#4 | Semiconductors | |
#5 | Audio-visual technology |
# | Technology | |
---|---|---|
#1 | Analysing materials | |
#2 | Measuring length, angles and areas | |
#3 | Image data processing | |
#4 | Optical systems | |
#5 | Semiconductor devices | |
#6 | Television |
# | Name | Total Patents |
---|---|---|
#1 | Srocka Bernd | 27 |
#2 | Langhans Ralf | 10 |
#3 | Schmidt Christine | 6 |
#4 | Zimmer Bjoern | 3 |
#5 | Flon Stanislas | 3 |
#6 | Wolf Guenther | 3 |
#7 | Doering Marko | 3 |
#8 | Siahkali Arman | 3 |
#9 | Raue Hagen | 3 |
#10 | Hinze Frank | 2 |
Publication | Filing date | Title |
---|---|---|
US2017115112A1 | Method and assembly for determining the thickness of a layer in a sample stack | |
EP3346229A1 | Method and assembly for determining the thickness of layers in a sample stack | |
US2015285745A1 | Inspection assembly | |
DE102012111835A1 | inspection device | |
DE102012103428A1 | inspection arrangement | |
DE102012102756A1 | Method for detecting buried layers | |
DE102012101242A1 | inspection procedures | |
DE102011052943A1 | inspection procedures | |
DE102011052721A1 | Measuring method for height profiles of surfaces | |
DE102011051355A1 | inspection device | |
DE102011050674A1 | Arrangement for generating a differential interference contrast image | |
DE102010060375A1 | inspection procedures | |
DE102010060376A1 | inspection procedures | |
LT2009075A | Inspectation method | |
DE102009026187A1 | inspection system | |
DE102009026186A1 | Device and method for edge and surface inspection |