| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 6 | |
| #2 | WIPO (World Intellectual Property Organization) | 4 | |
| #3 | China | 2 | |
| #4 | EPO (European Patent Office) | 2 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Audio-visual technology | |
| #3 | Computer technology | |
| #4 | Optics | |
| #5 | Machines |
| # | Name | Total Patents |
|---|---|---|
| #1 | Hirayama Takuma | 7 |
| #2 | Akiyama Yoshihiro | 6 |
| #3 | Yamamoto Yosuke | 4 |
| #4 | Wada Takahiko | 3 |
| #5 | Yang Yong | 1 |
| #6 | Yoshihiro Akiyama | 1 |
| #7 | Iwano Yukio | 1 |
| #8 | Akiyama Sakie | 1 |
| Publication | Filing date | Title |
|---|---|---|
| US2020264113A1 | Inspection position identification method, three-dimensional image generation method, and inspection device | |
| US2006165273A1 | Appearance inspection apparatus for inspecting inspection piece |