| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 12 | |
| #2 | WIPO (World Intellectual Property Organization) | 4 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Computer technology | |
| #3 | Semiconductors | |
| #4 | Basic communication technologies |
| # | Technology | |
|---|---|---|
| #1 | Measuring electric variables | |
| #2 | Semiconductor devices | |
| #3 | Electric digital data processing | |
| #4 | Pulse technique | |
| #5 | Static stores | |
| #6 | Measuring temperature |
| # | Name | Total Patents |
|---|---|---|
| #1 | Zheng Yongjun | 9 |
| #2 | Pan Weiwei | 8 |
| #3 | Lan Fan | 6 |
| #4 | Shi Zheng | 4 |
| #5 | Ouyang Xu | 3 |
| #6 | Yang Shenzhi | 2 |
| #7 | Tang Zhong | 2 |
| #8 | Shao Kangpeng | 2 |
| #9 | Liu Yongli | 2 |
| #10 | Huang Zhenyan | 1 |
| Publication | Filing date | Title |
|---|---|---|
| WO2020135258A1 | Addressable test chip capable of improving resistance measurement accuracy and test system thereof | |
| WO2020135257A1 | Addressable test chip and system capable of reducing leakage current | |
| US2017059645A1 | Addressable test circuit and test method for key parameters of transistors | |
| US2016061895A1 | Addressable ring oscillator test chip |