| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Republic of Korea | 4 | |
| #2 | United States | 3 | |
| #3 | China | 2 | |
| #4 | EPO (European Patent Office) | 1 | |
| #5 | Singapore | 1 | |
| #6 | Taiwan | 1 | |
| #7 | WIPO (World Intellectual Property Organization) | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement |
| # | Technology | |
|---|---|---|
| #1 | Measuring electric variables |
| # | Name | Total Patents |
|---|---|---|
| #1 | Yokoo Masayoshi | 12 |
| #2 | Harada Keitaro | 12 |
| #3 | Matsumoto Shouhei | 12 |
| #4 | Koizumi Mitsuo | 10 |
| #5 | Arai Yoshinori | 8 |
| #6 | Hasebe Shinichi | 6 |
| #7 | Ueno Satoshi | 6 |
| #8 | Togashi Fumiaki | 3 |
| #9 | Yoshinori Arai | 1 |
| #10 | Shinichi Hasebe | 1 |
| Publication | Filing date | Title |
|---|---|---|
| SG11201801519PA | Ic test system | |
| TW201708834A | IC test system | |
| KR20160093034A | IC Handler | |
| KR20160093033A | IC Handler |