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OHT INC

Overview
  • Total Patents
    285
  • GoodIP Patent Rank
    80,986
  • Filing trend
    ⇩ 100.0%
About

OHT INC has a total of 285 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 1997. It filed its patents most often in Japan, Taiwan and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, audio-visual technology and semiconductors are PRO 2000 CO LTD, KODI S CO LTD and PRO-2000 CO LTD.

Patent filings in countries

World map showing OHT INCs patent filings in countries

Patent filings per year

Chart showing OHT INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Ishioka Shogo 121
#2 Yamaoka Shuji 117
#3 Hamori Hiroshi 69
#4 Ishioka Seigo 68
#5 Yamaoka Hideji 52
#6 Fujii Tatsuhisa 21
#7 Shogo Ishioka 15
#8 Odan Yuji 14
#9 Shuji Yamaoka 14
#10 Nurioka Akira 12

Latest patents

Publication Filing date Title
CN107567199A Non-contact type circuit pattern checks prosthetic device
JP2018009976A Non-contact type circuit pattern inspection/repair device
JP2017215257A Contactless circuit board tester and testing method
JP2017116332A Conductor pattern inspection device
JP2017116331A Conductor pattern inspection device
JP2015166680A Contact type circuit pattern detection device and detection method of the same
JP2014190743A Circuit pattern inspection device
JP2014134398A Circuit pattern inspection device
JP2013191682A Electrode substrate, circuit pattern inspection apparatus including the same
JP2012150078A Circuit pattern inspection device
JP2011033542A Circuit pattern inspection apparatus
WO2009131230A1 Circuit inspection device and method for inspecting circuit
JP2009229467A Circuit pattern inspection device
JP2010147204A Screening device and screening method using plasma
JP2010139377A Circuit pattern inspection device and method of inspecting circuit pattern thereof
JP2009080042A Circuit pattern inspection device
JP2008292372A Circuit inspection device equipped with inspection support system, and inspection support method therefor
JP2008175592A Linear scale probe used for substrate inspection system
JP2008175593A Harness inspection system
JP2008175594A Linear scale probe used for substrate inspection system