YULIM HITECH INC has a total of 17 patent applications. Its first patent ever was published in 2000. It filed its patents most often in Republic of Korea, Japan and Taiwan. Its main competitors in its focus markets measurement, semiconductors and electrical machinery and energy are MICO TN LTD, KOYO TECHNOS KK and TSE CO LTD.
# | Country | Total Patents | |
---|---|---|---|
#1 | Republic of Korea | 11 | |
#2 | Japan | 2 | |
#3 | Taiwan | 2 | |
#4 | United States | 2 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Semiconductors | |
#3 | Electrical machinery and energy | |
#4 | Audio-visual technology | |
#5 | Optics |
# | Technology | |
---|---|---|
#1 | Measuring electric variables | |
#2 | Semiconductor devices | |
#3 | Display controls | |
#4 | Electrically-conductive connections | |
#5 | Nonlinear optics |
# | Name | Total Patents |
---|---|---|
#1 | Jun Tae Un | 9 |
#2 | Yoon Soo | 5 |
#3 | Jun Tae-Un | 3 |
#4 | Yoon Su | 1 |
Publication | Filing date | Title |
---|---|---|
TW200602655A | Probe card for testing a semiconductor device | |
KR20060003315A | Probe card for testing semiconductor | |
KR20050097233A | Probe card for testing lcd | |
KR20040089244A | Needle assembly of probe card | |
KR20040082745A | Needle for probe card | |
KR20030037279A | Probe card for testing lcd | |
KR20030020486A | Probe card for testing lcd | |
KR20020093381A | Probe card for testing semiconductor | |
KR20020093380A | Probe card for testing semiconductor | |
KR20020093383A | Probe card for testing LCD | |
KR20020093382A | Probe card for testing LCD | |
KR20010111118A | Probe card |