Learn more

YANG ELECTRONIC SYSTEMS CO LTD

Overview
  • Total Patents
    27
  • GoodIP Patent Rank
    218,350
About

YANG ELECTRONIC SYSTEMS CO LTD has a total of 27 patent applications. Its first patent ever was published in 2004. It filed its patents most often in Republic of Korea, China and Taiwan. Its main competitors in its focus markets measurement, audio-visual technology and optics are PRO 2000 CO LTD, PRO-2000 CO LTD and OHT INC.

Patent filings in countries

World map showing YANG ELECTRONIC SYSTEMS CO LTDs patent filings in countries
# Country Total Patents
#1 Republic of Korea 21
#2 China 3
#3 Taiwan 2
#4 Japan 1

Patent filings per year

Chart showing YANG ELECTRONIC SYSTEMS CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kim Jong Moon 20
#2 Cho Won Il 10
#3 Park Jun Sic 10
#4 Lee Won Kyu 9
#5 Ryu Sang Chan 9
#6 Kim In Soo 7
#7 Lee Jung Min 4
#8 Cho Woon Il 3
#9 Song Tae Mong 2
#10 Yuanyi Zhao 2

Latest patents

Publication Filing date Title
KR101601903B1 Probe test apparatus for flat pannel display
KR20150095377A Automatically compensating location apparatus for probe card of probe test apparatus for flat pannel display
KR101383032B1 Probe card detaching structure of probe test apparatus
KR101416882B1 Probe pin contact check system of probe test apparatus
KR101352125B1 Adjustment apparatus for flatness of stage in lcd inspection equipment
KR101355531B1 Rotation apparatus for head unit of lcd inspection equipment
KR20140074517A Back light apparatus of probe system for flat panel display
KR101355530B1 Top light apparatus of probe system for flat panel display
KR101248135B1 Probe test apparatus using by air bearing
KR101248136B1 Jig apparatus for align of probe card
KR20130057033A Array test apparatus having multiple head unit
TW201031938A Cooling and moisture-proofing apparatus for use in electric property test of flat panel display substrate
KR20110072584A Probe driving apparatus capable of automatically compensating location of probe pin
KR20110042760A Electric property tester for fpd substrate having function preventing damage from static electricity
KR20100097810A Apparatus for operating of prob pin in probing apparatus
KR20100095866A Apparatus for probing flat panel display
KR20100095865A Apparatus for cooling and desiccating fpd substrate during the electric property test
KR100768912B1 Probe inspection apparatus
KR20070116514A Probe test apparatus of flat pannel display and probe test method using it
KR20070094352A Probe test apparatus of flat pannel display