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NIDEC-READ CORP

Overview
  • Total Patents
    61
  • GoodIP Patent Rank
    31,959
  • Filing trend
    ⇩ 85.0%
About

NIDEC-READ CORP has a total of 61 patent applications. It decreased the IP activity by 85.0%. Its first patent ever was published in 2009. It filed its patents most often in Japan, WIPO (World Intellectual Property Organization) and Taiwan. Its main competitors in its focus markets measurement, computer technology and audio-visual technology are MEMBRAIN LTD, ZEHNTEL INC and HUNTRON INSTR INC.

Patent filings in countries

World map showing NIDEC-READ CORPs patent filings in countries

Patent filings per year

Chart showing NIDEC-READ CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kusuda Tatsufumi 17
#2 Yamashita Munehiro 13
#3 Ota Norihiro 10
#4 Takahashi Tadashi 7
#5 Honda Mutsuhiro 4
#6 Matsukawa Toshihide 3
#7 Tsujimoto Masayuki 3
#8 Kato Minoru 3
#9 Nakayama Takafumi 3
#10 Kitazawa Kazutaka 3

Latest patents

Publication Filing date Title
WO2018021216A1 Inspection jig, substrate inspection device, and method for manufacturing inspection jig
WO2017212814A1 Inspection jig and inspection device
WO2017051696A1 Iris authentication device
JP2017142189A Inspection jig, inspection jig set, and substrate inspection device
JP2017142080A Contact terminal, inspection tool, and inspection device
CN105866606A Connection detector
JP2017122376A Iris authentication device for door and iris authentication system
JP2016149120A Connection inspection device
JP2017062756A Iris authentication apparatus
JP2017097741A Iris authentication device and iris authentication system
JP2017096788A Inspection jig, substrate inspection device, and substrate inspection method
JP2017083962A Iris authentication device, vehicle with iris authentication device
JP2017054773A Connection jig, substrate inspection device, and manufacturing method for connection jig
JP2017047349A Actuator
JP2017020991A X-ray test device and x-ray test method
JP2017015487A X-ray inspection device
JP2016211857A Substrate for sensor, non-contact sensor of substrate inspection device, and manufacturing method of the same
JP2016186471A Inspection jig, substrate inspection device, and manufacturing method for inspection jig
JP2016149275A Relay connector and substrate inspection device
JP2016128750A Substrate inspection device, substrate inspection method and jig for substrate inspection