|
US10247777B1
|
|
Detecting and locating shoot-through timing failures in a semiconductor integrated circuit
|
|
US2015149106A1
|
|
Field triage of EOS failures in semiconductor devices
|
|
US2014115551A1
|
|
Correlation of device manufacturing defect data with device electrical test data
|
|
US2014115412A1
|
|
Scan chain fault diagnosis
|
|
WO2007114930A2
|
|
Secure test-for-yield chip diagnostics management system and method
|
|
WO2004106955A1
|
|
Tester architecture for testing semiconductor integrated circuits
|
|
US2004078165A1
|
|
Scan test viewing and analysis tool
|
|
US2004068699A1
|
|
Single board DFT integrated circuit tester
|
