| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 6 | |
| #2 | WIPO (World Intellectual Property Organization) | 5 | |
| #3 | Australia | 1 | |
| #4 | China | 1 | |
| #5 | EPO (European Patent Office) | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Machines | |
| #3 | Optics | |
| #4 | Semiconductors | |
| #5 | Machine tools |
| # | Name | Total Patents |
|---|---|---|
| #1 | Erickson Andrew Norman | 10 |
| #2 | Hare Casey Patrick | 8 |
| #3 | Erickson Andrew N | 3 |
| #4 | Riley Anton Lewis | 2 |
| #5 | Ippolito Stephen Bradley | 2 |
| #6 | Norman Erickson Andrew | 1 |
| #7 | Riley Anton L | 1 |
| #8 | Patrick Hare Casey | 1 |
| #9 | Markakis Jeffrey M | 1 |
| Publication | Filing date | Title |
|---|---|---|
| WO2015179702A1 | Apparatus and method for atomic force, near-field scanning optical microscopy | |
| WO2013184170A2 | Semiconductor wafer isolated transfer chuck | |
| US2010148813A1 | Apparatus and method for combined micro-scale and nano-scale c-v, q-v, and i-v testing of semiconductor materials | |
| US2007084273A1 | Deconvolving tip artifacts using multiple scanning probes | |
| AU2003256451A1 | Software synchronization of multiple scanning probes |