| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 9 | |
| #2 | WIPO (World Intellectual Property Organization) | 4 | |
| #3 | China | 3 | |
| #4 | EPO (European Patent Office) | 3 | |
| #5 | Republic of Korea | 3 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Textiles and paper | |
| #3 | Semiconductors |
| # | Technology | |
|---|---|---|
| #1 | Scanning-probe techniques | |
| #2 | Typewriters | |
| #3 | Measuring electric variables | |
| #4 | Semiconductor devices |
| # | Name | Total Patents |
|---|---|---|
| #1 | Amponsah Kwame | 22 |
| #2 | Ozdogan Mehmet | 1 |
| #3 | Tan Sirui | 1 |
| Publication | Filing date | Title |
|---|---|---|
| WO2020257190A1 | Mems probe card with angled probes | |
| US2019250186A1 | Multiple integrated tips scanning probe microscope with pre-alignment components | |
| US2017261544A1 | Functional prober chip | |
| EP3262425A1 | Systems and methods for manufacturing nano-electro-mechanical-system probes | |
| KR20190057442A | Multiple integrated tips scanning probe microscope |