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Scanning stylus atomic force microscope with cantilever tracking and optical access
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Feedback control for scanning tunnel microscopes
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Method and apparatus for obtaining improved vertical metrology measurements
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Scanning probe microscope having automatic probe exchange and alignment
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Tapping atomic force microscope with phase or frequency detection
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Scan control for scanning probe microscopes
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Scanning stylus atomic force microscope with cantilever tracking and optical access
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Jumping probe microscope
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Scanning probe microscope using stored data for vertical probe positioning
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Methods of operating atomic force microscopes to measure friction
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Positioning device for scanning probe microscopes
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Tapping atomic force microscope
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Atomic force microscope for small samples having dual-mode operating capability
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Method of adjusting the size of the area scanned by a scanning probe
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Atomic force microscope
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Scanner for scanning probe microscopes having reduced Z-axis non-linearity
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Atomic force microscope
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Compact atomic force microscope
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Method of driving a piezoelectric scanner linearly with time
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Method of operating a scanning probe microscope to improve drift characteristics
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